Kiet Duong (University of York) - Sanctions and Knowledge Spillovers

BOFIT seminars

BOFIT Seminar - Kiet Duong (University of York) - Sanctions and Knowledge Spillovers

Co-authors:  Toan Huynh (Queen Mary University of London), Steven Ongena (University of Zurich) and Nam Vu (Miami University)

Abstract
We study whether patent applicants bear significant costs under the impacts of international sanctions by leveraging microdata from Russia, one of the world’s most heavily sanctioned countries. First, we find that filings from Russian applicants are subject to longer processing times in the sanctioning countries’ patent offices. Second, Russian patents applied in the sanctioning countries exhibit fewer forward citations. Our results are explainable by several mechanisms. On the one hand, name bias (i.e., Russian applicants’ names are similar to the ones of Kremlin or the Top 20 popular Russian first names) and application experience (i.e., having filed patents in the patent office in the last three years) shorten the processing duration and induce greater forward citations. On the other hand, revenge sanctions that Russia imposes on the patent offices’ countries that have imposed sanctions on Russia even lengthen the granting duration and lower forward citations.

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